Teaching

North Carolina State University

• ECE 528: Semiconductor Material and Device Characterization – Spring 2015
• MSE 791-002: Advanced X-ray diffraction – Spring 2013
• ECE 723: Optical properties of semiconductors – Fall 2012 (ECE723)
• MSE 791-007: Advanced X-ray diffraction – Spring 2012

Linkoping University, Sweden

• Analytical methods for materials science – Fall 2002, Fall 2003, Fall 2004
• New materials – Spring 2001, Spring 2002, Spring 2003, Spring 2004

Sofia University, Bulgaria

• Low-dimensional semiconductor structures – technology and applications, Fall 1996