Active Research Focus in Our Lab

  • Investigating methods for completely redesigning architecture to enhance security, power efficiency, and performance, exploring new paradigms of computing.
  • Investigating novel AI algorithms inspired by brain functionalities for enhancing computing performance, security, and power efficiency through advanced microarchitecture.
  • Designing AI algorithm for emergence capabilities in architecture design and analysis.
  • Security of AI accelerator solutions.
  • Theory of microarchitectural side channel attacks.
  • Novel tools for microarchitecture design for performance.
  • Novel tools for security analysis, and on-chip microarchitecture security feature design.
  • Novel mitigation methodologies for microarchitectural and transient execution side channel attacks.
  • AI trust and interpretability for hardware design and security.
  • Pathfinding and research on hardware security analysis tools.
  • Microarchitecture cryptoanalysis and hardware mitigations for side channel and fault injection resiliency.
  • Microarchitecture design of trusted execution engine and its security.
  • Use of AI to accelerate or enhance security and security developed to protect AI technologies from a hardware standpoint.
  • Use of analytics and machine learning to improve processor design, security and power.
  • Groundbreaking advancements in foundational capabilities of AI, including next-generation performance optimization techniques, microarchitecture verification, and resilience against adversarial behavior.
  • Innovations in scalable, automated tools and methodologies for hardware design and Formal verification that are effective in addressing common security weaknesses, significantly improving CPU performance and efficiency.
  • Emerging AI usages in threat analysis, systemic mitigations, and security enhancements that strengthen High Performance computing, accelerant, and remote communication solutions.
  • Architectural and micro-architecture, innovations that improve resiliency and reliability of silicon and electronics against transient faults.